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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Secondary ion emissions from carbon nanotubes induced by MeV Si and Si_2 clusters
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Secondary ion emissions from carbon nanotubes induced by MeV Si and Si_2 clusters

机译:MeV Si和Si_2团簇引起的碳纳米管的二次离子排放

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摘要

Secondary ion emissions from carbon nanotubes under bombardments of MeV Si and Si_2 clusters are measured by using a time of flight (TOF spectrometer). The measurements show that the emission yields of the secondary ions increase with increasing energy of Si and the secondary ion emissions are attributed to the electronic stopping processes. The emission yields of the secondary ions decrease with increasing energy of Si_2 clusters and the vicinage effect of cluster constituents plays more significant role in the enhanced secondary ion emissions at the low energies.
机译:通过飞行时间(TOF光谱仪)测量在MeV Si和Si_2团簇轰击下碳纳米管的二次离子排放。测量结果表明,随着Si能量的增加,二次离子的发射量也随之增加,并且二次离子的发射归因于电子停止过程。随着Si_2团簇能量的增加,二次离子的发射量降低,并且团簇成分的附近效应在低能下增强的二次离子发射中起着更重要的作用。

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