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首页> 外文期刊>Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms >Micro-PIXE analysis of reference standards for the quantitative analysis of trace elements in individual raindrops
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Micro-PIXE analysis of reference standards for the quantitative analysis of trace elements in individual raindrops

机译：Micro-PIXE分析标准品，用于定量分析单个雨滴中的痕量元素

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The quantitative analysis of trace elements is one of important keys for studying numerous processes of research interest in the environmental science. Here, we present the results of a preliminary study for the quantitative analysis of five trace elements retained in a single raindrop. To prepare the reference standards with uniform thickness. Si, K.C1, CaF_2 and Fe reference reagents were deposited on substrate films by evaporation system. Micro-PIXE analysis was performed at the division of TIARA in Japan Atomic Energy Research Institute. Through the analysis of these standard samples, each element calibration curve was successfully plotted by mass thickness ((μg cm~(-2)) and peak counts (counts nC~(-1)) obtained from 2.6 MeV H~+ microbeam. For the sampling of individual raindrops, a field measurement was carried out at Kyoto University in November 2001. It was possible to calculate the mass thickness and mass of each element retained in individual raindrops using each elemental calibration curve, sample's net counts and microbeam scanning area.
机译：痕量元素的定量分析是研究环境科学中众多研究兴趣过程的重要关键之一。在这里，我们介绍了对单个雨滴中保留的五种微量元素进行定量分析的初步研究结果。制备厚度均匀的参考标准。通过蒸发系统将Si，K.Cl，CaF_2和Fe参考试剂沉积在基底膜上。 Micro-PIXE分析是在日本原子能研究所的TIARA部门进行的。通过对这些标准样品的分析，成功地通过质量厚度（（μgcm〜（-2））和从2.6 MeV H〜+微束获得的峰数（计数nC〜（-1））绘制了每个元素校准曲线。对于单个雨滴的采样，2001年11月在京都大学进行了实地测量。可以使用每个元素校准曲线，样品的净计数和微束扫描面积来计算单个雨滴中保留的每个元素的质量厚度和质量。

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