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Anisotropic energies of sputtered atoms under oblique ion incidence

机译:斜离子入射下溅射原子的各向异性能

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The energy of sputtered atoms that are emitted from ion-bombarded targets is an important factor in thin film technology. In particular, bombardment by obliquely incident ions is of interest for applications since it leads to more efficient sputtering in comparison to normal incidence. In this paper, we investigate the angle-resolved energy distributions of atoms sputtered by obliquely incident ion beams by the mea'ns of numerical modeling. We identify major trends that govern the sputtering anisotropies and provide a semi-empirical dependence, which describes the energy distributions and the average energies of atoms emitted under oblique ion impact. This dependence replaces the well-known Thompson formula in cases when anisotropies are important.
机译:从离子轰击靶发射的溅射原子的能量是薄膜技术中的重要因素。特别地,倾斜入射离子的轰击对于应用是令人感兴趣的,因为与法向入射相比,其导致更有效的溅射。在本文中,我们通过数值建模的方法研究了斜入射离子束溅射的原子的角度分辨能量分布。我们确定了控制溅射各向异性的主要趋势,并提供了半经验相关性,该关系描述了斜离子碰撞下发射的原子的能量分布和平均能量。在各向异性很重要的情况下,这种依赖性取代了众所周知的汤普森公式。

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