Thickness effect correction in XAFS-spectroscopy: Temperature measurement approach

E. Voronina; D. Guy; T. Miyanaga

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Thickness effect correction in XAFS-spectroscopy: Temperature measurement approach

机译：XAFS光谱中的厚度效应校正：温度测量方法

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The distortion of extended X-ray absorption fine structure (EXAFS)-amplitude due to the non-uniformity effect of the sample thickness is the problem resulting in incorrect determination of local atomic structure parameters. In this work the procedure of EXAFS-spectra correction for this effect based on combination of the data taken at different temperatures is proposed. The results of test calculations and correction of experimental EXAFS-spectra of inter-metallics illustrate the efficiency of the method.

机译：由于样品厚度的不均匀效应而导致的扩展的X射线吸收精细结构（EXAFS）幅度的失真是导致对局部原子结构参数的错误确定的问题。在这项工作中，提出了基于在不同温度下获取的数据组合的EXAFS光谱校正效果的程序。金属间化合物的EXAFS光谱的测试计算和校正结果说明了该方法的有效性。

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《Nuclear Instruments & Methods in Physics Research. B, Beam Interactions with Materials and Atoms》 |2004年第4期|p.525-530|共6页
作者
E. Voronina; D. Guy; T. Miyanaga;
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作者单位

Physical-Technical Institute of UrD RAS, 132 Kirov Str., Izhevsk 426001, Russia;

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原文格式 PDF
正文语种 eng
中图分类原子核物理学、高能物理学;原子能技术;
关键词
EXAFS-spectra; thickness effect; powders; temperature measurements;

机译：EXAFS光谱;厚度效应;粉末;温度测量;

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Thickness effect correction in XAFS-spectroscopy: Temperature measurement approach

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