机译:Rapid thermal annealing effects on step-graded InAlAs buffer layer and In_(0.52)Al_(0.48)As/In_(0.53)Ga_(0.47)As metamorphic high electron mobility transistor structures on GaAs substrates
机译:Ultralow dark currentphyphen;type strainedhyphen;layer InGaAs/InAlAs quantum well infrared photodetector with background limited performance forTle;100 K