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首页> 外文会议>Iron ore 2011 >New Innovations in Field Portable X-Ray Fluorescence for the Iron Ore Industry
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New Innovations in Field Portable X-Ray Fluorescence for the Iron Ore Industry

机译：铁矿石行业现场便携式X射线荧光的新创新

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摘要

In-field sampling programs generally take time, equating to money, and unless you have an onsiternlaboratory, you have the issue of having to wait long periods for your data. Until recently, fi eldrnportable X-ray fl uorescence (FPXRF) analysers, which can help provide instant indicative results,rnwere not able to detect penalty elements, such as Al and Si, or do so reliably enough to act upon.rnThe purpose then of this fi eld test then was to show that the latest FPXRF devices are capable ofrnproducing reliable readings on fi eld samples of variable grain size, in particular for Al and Si, suchrnthat the readings still correlate well with the assay for those samples and thus be reliable for anrniron ore grade control application.rnWe tested RC chip samples on-site in the Pilbara, Western Australia, with the Niton, analysing forrna range of elements including Fe, Mn, Al and Si and then compared the results for those elementsrnagainst assay data for the same. A strong correlation would tell us that the FPXRF results werernreliable. Furthermore, to show the effect of simple sample preparation, we also analysed pulps ofrnthe same samples in the same way.rnThe correlations were good for the all of the four elements of interest for the RC chip samplesrn(R2 values between 0.82 and 0.9), and excellent for the pulps (R2 values between 0.89 and 0.998).rnThe results also showed a direct correlation between sample preparation and improved quality ofrnresults with the FPXRF.rnThe data showed allowed for two conclusions:rn1. the FPXRF can produce data from unprepared RC chips for Al and Si that, when comparedrnwith assay, is reliable for a fi eld application in drilling and grade control; andrn2. the greatest limitation to data quality is sample preparation.
机译：现场采样程序通常需要花费时间，等同于金钱，并且除非您有实验室，否则您将不得不等待很长时间才能获得数据。直到最近，便携式X射线荧光（FPXRF）分析仪仍可提供即时的指示性结果，无法检测Al和Si等罚分元素，或者足够可靠地起作用。然后，该现场测试表明，最新的FPXRF设备能够在可变粒径的现场样品上产生可靠的读数，特别是对于Al和Si，这样读数仍与这些样品的测定法相关性很好，因此是可靠的我们使用Niton在澳大利亚西部的皮尔巴拉（Pilbara）现场测试了RC芯片样品，分析了铁，锰，铝和硅的元素含量范围，然后将这些元素的结果与分析数据进行了比较。相同。强大的相关性将告诉我们FPXRF结果是可靠的。此外，为了显示简单样品制备的效果，我们还以相同的方式分析了相同样品的果肉。对于RC芯片样品，所有相关的四个元素都具有良好的相关性（R2值在0.82至0.9之间），结果也显示了样品制备与FPXRF改进的结果质量之间的直接关系。数据表明有两个结论：rn1。 FPXRF可以从未经准备的RC芯片中获得Al和Si的数据，与测定法进行比较时，该数据对于钻井和坡度控制领域的现场应用是可靠的；安德鲁2。数据质量的最大限制是样品制备。

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  • 来源
    《Iron ore 2011》|2011年|p.191-206|共16页
  • 会议地点 Perth(AU)
  • 作者

    S Bailey;

  • 作者单位

    Mining, Portable Analytical Solutions Pty Ltd, 4/45 Ventnor Avenue, West Perth WA 6005. Email: SBailey@PortableAS.com;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 铁矿石;
  • 关键词

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